4-5 NOVEMBER 2026, The NEC Birmingham    |

Advanced Microscopy & Analysis

Advanced Microscopy & Analysis

Share product:

Facebook
Twitter
LinkedIn
WhatsApp

Description

· Thermo Fisher Spectra 300 Cs-corrected S/TEM

· Thermo Fisher Talos F200i S-FEG TEM (with EDS, STEM imaging, HAADF)

· Zeiss Crossbeam FIB SEM

· Thermo Fisher Apreo 2 S HiVac SEM (with EDS, EBSD and in-chamber serial block-face ultramicrotome)

· Cameca LEAP 5000 XR atom probe

· Bruker D8 Discover XRD for phase ID, stress and texture measurements (room and elevated temperatures)

Other products