Bowman P Series XRF

High-precision XRF coating thickness analysis with automated multi-point measurement for metal finishing.

The Bowman P Series XRF is a high-precision benchtop XRF analyser designed for non-destructive coating thickness measurement, elemental analysis and quality control across metal finishing, plating, electronics and manufacturing applications.

A fully programmable motorised X-Y stage enables precise positioning and automated multi-point measurement, making the P Series particularly well suited to high-throughput inspection, batch testing and applications where multiple areas of a component need to be analysed. It can accommodate a wide range of sample sizes and shapes, including fasteners, electrical connectors, plated components and printed circuit boards.

The system combines a high-resolution silicon drift detector, 50 W micro-focus X-ray tube, multiple collimators and laser autofocus to provide fast and repeatable measurements. A variable focal range allows analysis of recessed or irregular areas, while the high-resolution camera supports accurate sample positioning and results traceability.

For metal finishing and coating applications, the P Series supports analysis from aluminium through to uranium and complies with recognised standards including ASTM B568 and DIN EN ISO 3497. It also meets IPC-4552, IPC-4553, IPC-4554 and IPC-4556 requirements for PCB coating applications.

For UK Metals visitors, the P Series provides a flexible solution for plating thickness control, incoming inspection, production QA/QC and automated verification of coated metal components.